Abstract Details
(2018) The Properties of Interfacial Layers Revealed by in situ X-Ray Reflectivity and Vertical Scanning Interferometry
Wild B, Daval D, Micha J-S, Ackerer P & Fernandez-Martinez A
Wild B, Daval D, Micha J-S, Ackerer P & Fernandez-Martinez A (2018) Goldschmidt Abstracts, 2018 2790
No presentation has been uploaded by the author.
The author has not provided any additional details.
Poster board 175 in Session 06m, Wednesday 15th August 22:15 - Thursday 16th August 00:15
Bastien Wild
View abstracts at 8 conferences in series
Damien Daval
Jean-Sébastien Micha View abstracts at 2 conferences in series
Philippe Ackerer View abstracts at 7 conferences in series
Alejandro Fernández-Martínez View all 5 abstracts at Goldschmidt2018
Damien Daval
Jean-Sébastien Micha View abstracts at 2 conferences in series
Philippe Ackerer View abstracts at 7 conferences in series
Alejandro Fernández-Martínez View all 5 abstracts at Goldschmidt2018
Listed below are questions that have been submitted by the community that the author will try and cover in their presentation. To submit a question, ensure you are signed in to the website. Authors or session conveners approve questions before they are displayed here.
No questions have been submitted
Sign in to ask a question.