(2018) The Properties of Interfacial Layers Revealed by in situ X-Ray Reflectivity and Vertical Scanning Interferometry
Wild B, Daval D, Micha J-S, Ackerer P & Fernandez-Martinez A
Wild B, Daval D, Micha J-S, Ackerer P & Fernandez-Martinez A (2018) Goldschmidt Abstracts, 2018 2790
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Poster board 175 in Session 06m, Wednesday 15th August 22:15 - Thursday 16th August 00:15
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