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(2016) Nanoscale Analysis of Zircon Standards by Atom Probe Microscopy

Saxey D, Reddy S, Rickard W, Fougerouse D & Van Riessen A

17d: 313+314, Tuesday @ 10:00 - 10:15

David W. Saxey View all 3 abstracts at Goldschmidt2016 View abstracts at 2 conferences in series
Steven Reddy View all 11 abstracts at Goldschmidt2016 View abstracts at 8 conferences in series
William D. A. Rickard View all 3 abstracts at Goldschmidt2016 View abstracts at 2 conferences in series
Denis Fougerouse View all 3 abstracts at Goldschmidt2016 View abstracts at 2 conferences in series
Arie Van Riessen View all 2 abstracts at Goldschmidt2016

Cite as: Saxey D, Reddy S, Rickard W, Fougerouse D & Van Riessen A (2016) Goldschmidt Abstracts, 2016 2755

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